发明名称 FIELD EFFECT TRANSISTOR
摘要 The present invention provides a field effect transistor both exhibiting an excellent performance at high voltage operation as well as a high frequency characteristic. In the present invention, a field effect transistor comprises a layer structure made of compound semiconductor (111) provided on a semiconductor substrate (110) made of GaAs or InP, as an operation layer, and employs a first field plate electrode (116) and a second field plate electrode (118); the second field plate electrode (118) comprises a shielding part (119) located in the region between the first field plate electrode (116) and a drain electrode (114), and serving to shield the first field plate electrode (116) from the drain electrode (114). In particular, when, in the cross sectional view in the gate length direction, the length in the gate length direction of an overlap region, in which the second field plate electrode (118) overlaps the upper part of a structure composed of the first field plate electrode (116) and a gate electrode (113), is designated as Lol, and the gate length is designated as Lg, the relation expressed as 0 ‰ Lol/Lg ‰ 1 holds.
申请公布号 EP1901342(A1) 申请公布日期 2008.03.19
申请号 EP20060766608 申请日期 2006.06.12
申请人 NEC CORPORATION 发明人 MIYAMOTO, HIRONOBU;ANDO, YUJI;OKAMOTO, YASUHIRO;NAKAYAMA, TATSUO;INOUE, TAKASHI;OTA, KAZUKI;WAKEJIMA, AKIO;KASAHARA, KENSUKE;MURASE, YASUHIRO;MATSUNAGA, KOHJI;YAMANOGUCHI, KATSUMI;SHIMAWAKI, HIDENORI
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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