发明名称 Ionization gauge with operational parameters and geometry designed for high pressure operation
摘要 An ionization gauge to measure pressure and to reduce sputtering yields includes at least one electron source that generates electrons. The ionization gauge also includes a collector electrode that collects ions formed by the collisions between the electrons and gas molecules. The ionization gauge also includes an anode. An anode bias voltage relative to a bias voltage of a collector electrode is configured to switch at a predetermined pressure to decrease a yield of sputtering collisions.
申请公布号 US9404827(B2) 申请公布日期 2016.08.02
申请号 US201414174386 申请日期 2014.02.06
申请人 MKS Instruments, Inc. 发明人 Brucker Gerardo A.
分类号 G01L21/30;G01L21/32;G01L21/34;H01J41/02 主分类号 G01L21/30
代理机构 Hamilton, Brook, Smith & Reynolds, P.C. 代理人 Hamilton, Brook, Smith & Reynolds, P.C.
主权项 1. An ionization gauge to measure pressure comprising: an anode enclosing a volume; an electron source that generates electrons outside of the anode; an inside ion collector electrode, located inside of the anode, that collects ions formed by the impact between the electrons and gas molecules and atoms inside the anode; and an outside ion collector electrode, located outside of the anode, that collects ions formed by the impact between the electrons and gas molecules and atoms outside the anode, the outside ion collector electrode being closer than the inside ion collector electrode to the electron source, to collect ions at pressures above about 10−4 Torr.
地址 Andover MA US