| 摘要 |
In one embodiment, when a test program for testing a circuit specifies the application of a DC voltage to a particular node of the circuit, i) an operational amplifier of a circuit test system is configured to respond to remote feedback, wherein the remote feedback is responsive to a load on a circuit test system test pin that is coupled to the particular node, and ii) the DC voltage is applied to the particular node via the operational amplifier. When the test program specifies the application of a high-voltage waveform to the particular node, i) the operational amplifier is configured to respond to local feedback, wherein the local feedback is not responsive to the load on the test pin, and ii) at least a high-voltage portion of the high-voltage waveform is applied to the particular node via the operational amplifier. Other embodiments are also disclosed.
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