MICROSCOPIC IMAGING APPARATUS AND METHOD TO DETECT A MICROSCOPIC IMAGE.

摘要

The invention relates to amicroscopic imaging apparatus to provide an image of a sample. The apparatus having an illumination system to provide an illumination beam with radiation;and a sensor constructed and arranged to receive: a first image of a first diffraction pattern created by diffraction of the illumination beam on the sample; a second image of a second diffraction pattern created by diffraction of the illumination beam on the sample. The sensor may be connected with a processor running a program to retrieve phase information from the sample from the first and second image received by the sensor. The illumination system may have a first illumination device to provide the illumination beam with radiation of substantially a first wavelength; and a second illumination device to provide the illumination beam with radiation of substantially a second wavelength different than the first wavelength. The sensor may receive a first image of a first diffraction pattern created by diffraction of the illumination beam with radiation of substantially the first wavelength on the sample; and,a second image of a second diffraction pattern created by diffraction of the illumination beam with radiation of substantially the second wavelength on the sample.