发明名称 |
DETERMINING THREE-DIMENSIONAL INFORMATION FROM PROJECTIONS OR PLACEMENT OF TWO-DIMENSIONAL PATTERNS |
摘要 |
Embodiments of a shape measurement system and related methods are disclosed. In some embodiments, the system places a two-dimensional initial pattern, which can be implemented as a standalone molding or can be attached to a light source or printed on an outfit, onto a surface of a three-dimensional object. The system captures a transformed version of the initial pattern in two dimensions that is distorted due to the varying depth of the surface. The system then analyzes the transformed pattern and derives three-dimensional information regarding the target object. The analysis, which can incorporate a calibration process, can rely on the projection nature of the light source, the isomorphism/non-isomorphism of the initial pattern, and other factors. |
申请公布号 |
US2016252346(A1) |
申请公布日期 |
2016.09.01 |
申请号 |
US201514442707 |
申请日期 |
2015.05.12 |
申请人 |
Bourbaki 13, Inc. |
发明人 |
Bismuth Robert;Orner William D.;Rapoport Jacob;Rohatgi Amit |
分类号 |
G01B11/25;A61B5/107 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
1. A method of measuring a three-dimensional (3D) target object using two-dimensional (2D) patterns, comprising:
selecting an initial two-dimensional pattern; laying the initial pattern on a 3D target object for viewing from a viewpoint to obtain a 2D transformed pattern; computing first depth information regarding the target object based on the transformed pattern; identifying a region of the target object that is hidden from the viewpoint or has a complexity above a predetermined threshold, based on the transformed pattern and first depth information; and computing second depth information different from the first depth information regarding the region of the target object. |
地址 |
Seattle WA US |