| 摘要 |
PROBLEM TO BE SOLVED: To reduce electrical stubs of a connector type probe interface.SOLUTION: A connector has a housing 188 with an aperture 186 formed therein having one portion larger than the other portion. The housing 188 is mounted on a device under test (DUT) 156, and the housing is positioned over a plurality of electrical contacts 190. An electrical load 184 is positioned within the larger aperture of the housing 188 and has resistors disposed adjacent to an electrical contact assembly 182. A resilient member is positioned between the electrical load 184 and the DUT 156 such that a force directed on the electrical load 184 compresses the resilient member to allow contact between a plurality of electrical contacts of the electrical contact assembly 182 and the plurality of the electrical contacts on the DUT 156. Removing the force decompresses the resilient member and disconnects the plurality of contacts of the electrical contact assembly 182 from the plurality of electrical contacts of DUT 156. |
