发明名称 METHOD FOR FABRICATING A METAL RESISTOR IN AN IC CHIP AND RELATED STRUCTURE
摘要 According to one exemplary embodiment, an integrated circuit chip comprises a first interconnect metal layer. The integrated circuit chip further comprises a first intermediate dielectric layer situated over the first interconnect metal layer (10). The integrated circuit chip further comprises a metal resistor (26) situated over the first intermetallic dielectric layer and below a second intermetallic dielectric layer. The integrated circuit chip further comprises a second interconnect metal layer over the second intermetallic dielectric layer. The integrated circuit chip further comprises a first intermediate via connected to first terminal of the metal resistor, where the first intermediate via is further connected to a first metal segment patterned in the second interconnect metal layer. The integrated circuit chip further comprises a second intermediate via connected to a second terminal of the metal resistor, where the second intermediate via is further connected to a second metal segment (14) patterned in the second interconnect metal layer.
申请公布号 WO02075811(A3) 申请公布日期 2002.11.14
申请号 WO2002US05861 申请日期 2002.02.22
申请人 CONEXANT SYSTEMS, INC. 发明人 KAR ROY, ARJUN;HOWARD, DAVID;LIU, Q., Z.
分类号 H01L21/02;H01L27/08 主分类号 H01L21/02
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