发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes first semiconductor regions of a first conductivity type spaced apart from each other and second semiconductor regions of a second conductivity type between adjacent first semiconductor regions. At least one second semiconductor region includes a void having at least one outer surface with a crystal plane orientation of (100). A third semiconductor region of the second conductivity type is on each second semiconductor region and a fourth semiconductor region of the first conductivity type is on the third semiconductor region. A gate electrode on is disposed on each first semiconductor region to be adjacent to a third semiconductor region via a gate insulation layer.
申请公布号 US2016260797(A1) 申请公布日期 2016.09.08
申请号 US201514836697 申请日期 2015.08.26
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SATO Shinya;SAKUMA Tomoyuki;YOKOYAMA Noboru;MATSUDA Shizue
分类号 H01L29/04;H01L29/66;H01L21/02;H01L29/78;H01L21/306;H01L21/311;H01L21/324;H01L21/283;H01L29/06;H01L21/31 主分类号 H01L29/04
代理机构 代理人
主权项 1. A semiconductor device, comprising: a plurality of first semiconductor regions of a first conductivity type spaced apart along a first direction and extending in a second direction intersecting the first direction; a plurality of second semiconductor regions of a second conductivity type extending in the second direction, each second semiconductor region being between adjacent first semiconductor regions along the first direction, at least one second semiconductor region including a void having at least one outer surface having a crystal plane orientation of (100); a third semiconductor region of the second conductivity type on each second semiconductor region; a fourth semiconductor region of the first conductivity type on the third semiconductor region; and a gate electrode on each first semiconductor region and adjacent to the third semiconductor region via a gate insulation layer.
地址 Tokyo JP