发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device includes first semiconductor regions of a first conductivity type spaced apart from each other and second semiconductor regions of a second conductivity type between adjacent first semiconductor regions. At least one second semiconductor region includes a void having at least one outer surface with a crystal plane orientation of (100). A third semiconductor region of the second conductivity type is on each second semiconductor region and a fourth semiconductor region of the first conductivity type is on the third semiconductor region. A gate electrode on is disposed on each first semiconductor region to be adjacent to a third semiconductor region via a gate insulation layer. |
申请公布号 |
US2016260797(A1) |
申请公布日期 |
2016.09.08 |
申请号 |
US201514836697 |
申请日期 |
2015.08.26 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SATO Shinya;SAKUMA Tomoyuki;YOKOYAMA Noboru;MATSUDA Shizue |
分类号 |
H01L29/04;H01L29/66;H01L21/02;H01L29/78;H01L21/306;H01L21/311;H01L21/324;H01L21/283;H01L29/06;H01L21/31 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a plurality of first semiconductor regions of a first conductivity type spaced apart along a first direction and extending in a second direction intersecting the first direction; a plurality of second semiconductor regions of a second conductivity type extending in the second direction, each second semiconductor region being between adjacent first semiconductor regions along the first direction, at least one second semiconductor region including a void having at least one outer surface having a crystal plane orientation of (100); a third semiconductor region of the second conductivity type on each second semiconductor region; a fourth semiconductor region of the first conductivity type on the third semiconductor region; and a gate electrode on each first semiconductor region and adjacent to the third semiconductor region via a gate insulation layer. |
地址 |
Tokyo JP |