发明名称 |
ELECTRONIC DEVICE AND METHOD OF DETERMINING ABNORMALITY OF ELECTRONIC DEVICE CONNECTING UNIT |
摘要 |
An electronic device and method of determining an abnormality or a normality of a connecting unit in an electronic device is provided. The electronic device includes an external device connecting unit having a first function connecting unit and a second function connecting unit, wherein the first function connecting unit includes a first identification (first ID) pin configured to detect a connection with an external electronic device, and wherein the second function connecting unit includes a second identification (second ID) pin configured to detect the connection with the external electronic device, and a processor configured to determine that an abnormality occurs in the external device connecting unit when values measured from the first ID pin and the second ID pin satisfy a predetermined condition. |
申请公布号 |
US2016169956(A1) |
申请公布日期 |
2016.06.16 |
申请号 |
US201514971098 |
申请日期 |
2015.12.16 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
KIM Yeon-Beom |
分类号 |
G01R31/04;G01R31/02;G05B9/02 |
主分类号 |
G01R31/04 |
代理机构 |
|
代理人 |
|
主权项 |
1. An electronic device, comprising:
an external device connecting unit comprising a first function connecting unit and a second function connecting unit, wherein the first function connecting unit includes a first identification (first ID) pin configured to detect a connection with an external electronic device, and wherein the second function connecting unit includes a second identification (second ID) pin configured to detect the connection with the external electronic device; and a processor configured to determine that an abnormality or a normality occurs in the external device connecting unit when values measured from the first ID pin and the second ID pin satisfy a predetermined condition. |
地址 |
Gyeonggi-do KR |