发明名称 ELECTRONIC DEVICE AND METHOD OF DETERMINING ABNORMALITY OF ELECTRONIC DEVICE CONNECTING UNIT
摘要 An electronic device and method of determining an abnormality or a normality of a connecting unit in an electronic device is provided. The electronic device includes an external device connecting unit having a first function connecting unit and a second function connecting unit, wherein the first function connecting unit includes a first identification (first ID) pin configured to detect a connection with an external electronic device, and wherein the second function connecting unit includes a second identification (second ID) pin configured to detect the connection with the external electronic device, and a processor configured to determine that an abnormality occurs in the external device connecting unit when values measured from the first ID pin and the second ID pin satisfy a predetermined condition.
申请公布号 US2016169956(A1) 申请公布日期 2016.06.16
申请号 US201514971098 申请日期 2015.12.16
申请人 Samsung Electronics Co., Ltd. 发明人 KIM Yeon-Beom
分类号 G01R31/04;G01R31/02;G05B9/02 主分类号 G01R31/04
代理机构 代理人
主权项 1. An electronic device, comprising: an external device connecting unit comprising a first function connecting unit and a second function connecting unit, wherein the first function connecting unit includes a first identification (first ID) pin configured to detect a connection with an external electronic device, and wherein the second function connecting unit includes a second identification (second ID) pin configured to detect the connection with the external electronic device; and a processor configured to determine that an abnormality or a normality occurs in the external device connecting unit when values measured from the first ID pin and the second ID pin satisfy a predetermined condition.
地址 Gyeonggi-do KR
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