发明名称 |
Group III Nitride Semiconductor Device and Epitaxial Substrate |
摘要 |
Affords a Group III nitride semiconductor device having a structure that can improve the breakdown voltage. A Schottky diode (11) consists of a Group III nitride support substrate (13), a gallium nitride region (15), and a Schottky electrode (17). The Group III nitride support substrate (13) has electrical conductivity. The Schottky electrode (17) forms a Schottky junction on the gallium nitride region (15). The gallium nitride region (15) is fabricated on a principal face (13a) of the Group III nitride support substrate (13). The gallium nitride region (15) has a (10 <o ostyle="single">12)-plane XRD full-width-at-half-maximum of 100 sec or less.
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申请公布号 |
US2008315209(A1) |
申请公布日期 |
2008.12.25 |
申请号 |
US20060571990 |
申请日期 |
2006.01.20 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
MIURA KOUHEI;KIYAMA MAKOTO;SAKURADA TAKASHI |
分类号 |
H01L29/20 |
主分类号 |
H01L29/20 |
代理机构 |
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代理人 |
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主权项 |
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