发明名称 Group III Nitride Semiconductor Device and Epitaxial Substrate
摘要 Affords a Group III nitride semiconductor device having a structure that can improve the breakdown voltage. A Schottky diode (11) consists of a Group III nitride support substrate (13), a gallium nitride region (15), and a Schottky electrode (17). The Group III nitride support substrate (13) has electrical conductivity. The Schottky electrode (17) forms a Schottky junction on the gallium nitride region (15). The gallium nitride region (15) is fabricated on a principal face (13a) of the Group III nitride support substrate (13). The gallium nitride region (15) has a (10 <o ostyle="single">12)-plane XRD full-width-at-half-maximum of 100 sec or less.
申请公布号 US2008315209(A1) 申请公布日期 2008.12.25
申请号 US20060571990 申请日期 2006.01.20
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MIURA KOUHEI;KIYAMA MAKOTO;SAKURADA TAKASHI
分类号 H01L29/20 主分类号 H01L29/20
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