Integrated circuit chip tester with embedded micro link

摘要

A contact for testing an integrated circuit includes a contact body with multiple embedded links within the body having at least two axes of rotation. The contact body is hollow with cavities that house tubular resilient members to bias the embedded links in a first preferred orientation and position.

主权项

1. A contact for testing an integrated circuit, comprising:
an elongate contact body including a front surface and a rear surface, first and second side surfaces, and an upper surface, and a plurality of cavities in the elongate contact body, each cavity having associated therewith a first opening in the upper surface and a second opening in one of the side and front surfaces; a plurality of resilient tubular members, each disposed in a respective one of said plurality of cavities, each resilient tubular member having a longitudinal axis, each respective second opening associated with a respective cavity sized to receive its resilient tubular member thereinthrough; and a plurality of contact links each associated with a respective one of said tubular members and extending from said associated cavity through said respective first opening in the upper surface, the plurality of contact links biased by its respective tubular member in a first extended position, each contact link arranged for pivotal movement about an axis parallel to the axis of the respective tubular member.