MEASURING PARAMETERS OF A CUT GEMSTONE

摘要

Apparatus and corresponding methods for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location. Apparatus comprise a plurality of light sources, each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location. Apparatus further comprise a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters. The sensed light is received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location.

主权项

1. An apparatus for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location, the apparatus comprising:
a plurality of light sources each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location; and a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters, the sensed light being received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location.