发明名称 Semiconductor integrated circuit with tungston silicide nitride thermal resistor
摘要 A semiconductor integrated circuit includes a thermal resistor which is made of a tungsten silicon nitride containing at least about 5% by weight of silicon and formed on a semiconductor substrate directly or via an insulating film. The semiconductor integrated circuit is produced by a method including the steps of: forming a tungsten silicide nitride film on a semiconductor substrate; patterning the tungsten silicide nitride film in a predetermined pattern to form a thermal resistor; and forming a pair of electrodes to be connected to the thermal resistor. The semiconductor integrated circuit is provided so as to have a predetermined resistance by measuring electric characteristics of the semiconductor integrated circuit; obtaining a difference between the measured electric characteristics and desired electric characteristics to calculate a required adjusting amount of a resistance of the thermal resistor; and adjusting the resistance of the thermal resistor by the adjusting amount through heating of the thermal resistor with electric power.
申请公布号 US6025632(A) 申请公布日期 2000.02.15
申请号 US19970988799 申请日期 1997.12.11
申请人 MATSUSHITA ELECTRONICS CORP. 发明人 FUKUDA, TAKESHI;TAKENAKA, HIROSHI;FURUKAWA, HIDETOSHI;FUKUI, TAKESHI;UEDA, DAISUKE
分类号 H01L29/74;H01L21/822;H01L23/58;H01L27/04;H01L27/06;H01L27/08;(IPC1-7):H01L23/62 主分类号 H01L29/74
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