发明名称 |
PHASE CHANGE MEMORY STACK WITH TREATED SIDEWALLS |
摘要 |
Memory devices and methods for fabricating memory devices have been disclosed. One such method includes forming the memory stack out of a plurality of elements. An adhesion species is formed on at least one sidewall of the memory stack wherein the adhesion species has a gradient structure that results in the adhesion species intermixing with an element of the memory stack to terminate unsatisfied atomic bonds of the element. The gradient structure further comprises a film of the adhesion species on an outer surface of the at least one sidewall. A dielectric material is implanted into the film of the adhesion species to form a sidewall liner. |
申请公布号 |
US2016218282(A1) |
申请公布日期 |
2016.07.28 |
申请号 |
US201615090292 |
申请日期 |
2016.04.04 |
申请人 |
Micron Technology, Inc. |
发明人 |
Chan Tsz W.;Hu Yongjun Jeff;Lengade Swapnil;Qin Shu;McTeer Everett Allen |
分类号 |
H01L45/00;G11C13/00;H01L27/24 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A memory system comprising:
a controller to control the system; and a memory device, coupled to the controller, the memory device comprising multiple memory stacks, each memory stack comprising:
a first carbon electrode;a selector device on the first carbon electrode;a second carbon electrode on the selector device;a phase change material on the second carbon electrode;a third carbon electrode on the phase change material;an adhesion species doped into each sidewall of the memory stack, wherein the adhesion species is configured to intermix with the carbon of the second electrode; anda sidewall liner material on the sidewalls of the memory stack wherein the sidewall liner comprises a deposited film of the adhesion species that has been implanted with a dielectric material. |
地址 |
Boise ID US |