发明名称 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE AND METHOD FOR ETCHING THE SAME
摘要 A method for manufacturing a dual damascene structure includes forming a wiring layer over a substrate, forming an inorganic insulating film over the wiring layer, forming a via hole in the inorganic insulating film using a first resist pattern with an opening as an etching mask, removing the first resist pattern, forming an organic insulating film on the inorganic insulating film and in the via hole, forming a hard mask on the organic insulating film, forming a hard mask pattern using a second resist pattern with an opening on the hard mask as an etching mask, forming a wiring groove by etching the organic insulating film using the second resist pattern and the hard mask pattern as etching masks until the organic insulating film inside the via hole is eliminated and simultaneously eliminating the second resist pattern, and implanting a conductive substance into the via hole and wiring groove.
申请公布号 US2008318409(A1) 申请公布日期 2008.12.25
申请号 US20080110479 申请日期 2008.04.28
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 SAKATA TOYOKAZU
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项
地址