发明名称 PLASMA PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing device capable of controlling a plasma distribution when high-frequency electromagnetic waves of different frequencies are applied to a discharge mechanism in the plasma processing device in a case of carrying out plasma processing such as etching or CVD for manufacturing a semiconductor device. SOLUTION: An antenna 11 as a discharge mechanism is connected to a first power supply 13 and a second power supply 15, and at least either of them is turned OFF or ON so as to control a distribution of plasma.
申请公布号 JP2001326217(A) 申请公布日期 2001.11.22
申请号 JP20000147457 申请日期 2000.05.15
申请人 HITACHI LTD 发明人 YANO TASUKU;SASAKI ICHIRO;MAEDA KENJI
分类号 H05H1/46;C23C16/509;C23C16/511;C23F4/00;H01L21/205;H01L21/302;H01L21/3065 主分类号 H05H1/46
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