发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which improves arrangement efficiency of wiring by forming the wiring under a resin core bump.SOLUTION: A semiconductor device comprises: a first Al pad 12a formed on an IC substrate; first Al wiring 12b formed on the IC substrate and in the same layer with the first Al pad; a passivation film 13 formed on the first Al pad, the first Al wiring and the IC substrate; a first via hole 13a which is formed on the passivation film and located on the first Al pad; a first resin core which is formed on the passivation film at a position overlapping the first Al wiring in planar view; and first metal wiring 25 formed in the first via hole, on the first resin core and on the passivation film.
申请公布号 JP6015379(B2) 申请公布日期 2016.10.26
申请号 JP20120257158 申请日期 2012.11.26
申请人 セイコーエプソン株式会社 发明人 高野 道義
分类号 H01L21/60;H01L21/3205;H01L21/768;H01L23/12;H01L23/522 主分类号 H01L21/60
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