| 摘要 |
PROBLEM TO BE SOLVED: To provide a pixel defect detecting method which extracts those pixels taking low gradation levels for both high and low signal levels of a CCD, and combines the extracted results to detect the pixel defects without mistake, even if the pixel defects continue due to a transfer trouble on a charge transfer route. SOLUTION: For a solid state imaging device which takes out and outputs signal charges stored in a plurality of photoelectric converter elements on a charge transfer route; the pixel defect detecting method takes an image with an illuminating light of a specified light quantity to generate taken image signals, and detects those pixels having taken image signals below a specified level as pixels containing pixel defects. The method detects the pixels containing pixel defects, using taken image signals of an image taken with an illuminating light of a lower light quantity than the specified light quantity, in addition to the taken image signals with the illuminating light of the specified light quantity. COPYRIGHT: (C)2007,JPO&INPIT
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