发明名称 Resist composition and patterning process
摘要 A resist composition comprises a polymer which increases its alkali solubility under the action of an acid as a base resin, and a copolymer comprising recurring units containing a sulfonic acid amine salt and recurring units containing at least one fluorine atom as an additive. The composition is suited for immersion lithography.
申请公布号 US2008096131(A1) 申请公布日期 2008.04.24
申请号 US20070976279 申请日期 2007.10.23
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;KUSAKI WATARU;HARADA YUJI;YOSHIHARA TAKAO
分类号 G03C1/00;G03C5/00 主分类号 G03C1/00
代理机构 代理人
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