发明名称 SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE WITH HEATER SOCKET
摘要 A laminated heater socket useful in association with an integrated circuit (IC) device tester is having a socket with an embedded integrated heater. This laminated heater socket configuration allows for good thermal conductivity and better electrical signal transmission specially for testing high-speed integrated circuits.
申请公布号 WO2016160730(A1) 申请公布日期 2016.10.06
申请号 WO2016US24568 申请日期 2016.03.28
申请人 ESSAI, INC. 发明人 BARABI, Nasser;HO, Chee Wah;TIENZO, Joven R.;KRYACHEK, Oksana;NAZAROV, Elena V.
分类号 G01R1/04;G01R1/067;G01R1/44;G01R31/28 主分类号 G01R1/04
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