发明名称 |
SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE WITH HEATER SOCKET |
摘要 |
A laminated heater socket useful in association with an integrated circuit (IC) device tester is having a socket with an embedded integrated heater. This laminated heater socket configuration allows for good thermal conductivity and better electrical signal transmission specially for testing high-speed integrated circuits. |
申请公布号 |
WO2016160730(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
WO2016US24568 |
申请日期 |
2016.03.28 |
申请人 |
ESSAI, INC. |
发明人 |
BARABI, Nasser;HO, Chee Wah;TIENZO, Joven R.;KRYACHEK, Oksana;NAZAROV, Elena V. |
分类号 |
G01R1/04;G01R1/067;G01R1/44;G01R31/28 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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