发明名称 SLIT LAMP MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To appropriately and easily perform setting of an optical system of a slit lamp microscope.SOLUTION: A slit lamp microscope of an embodiment includes: an illumination system that includes a light source for outputting illumination light and a slit formation unit for forming a slit having a variable slit width, irradiates a subject's eye with illumination light having passed through the slit, and is capable of varying the amount of light and an irradiation angle of the illumination light; an observation system that includes a variable magnification optical system for varying an observation magnification and is used for observing the subject's eye; a storage unit that previously stores correspondence information associating the illumination system and/or observation system's reference setting condition in each of one or more observation methods with each of a plurality of regions of the subject's eye; a designation unit used for designating a region of the subject's eye; an acquisition unit that acquires a current setting state of the illumination system and/or observation system; and a search unit that searches for a reference setting condition corresponding to the designated region and an observation method corresponding to the current setting state, from the correspondence information.SELECTED DRAWING: Figure 3
申请公布号 JP2016165535(A) 申请公布日期 2016.09.15
申请号 JP20160100142 申请日期 2016.05.19
申请人 TOPCON CORP 发明人 UCHIYAMA TAKUMI
分类号 A61B3/135 主分类号 A61B3/135
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