发明名称 STRUCTURE ABNORMALITY DETECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a structure abnormality detection apparatus, which, even when a measurement point is changed, requires no adjustment of positional relationship between a vibrating section and a vibration measurement section which emit ultrasonic and laser beam while reducing the size thereof.SOLUTION: A structure abnormality detection apparatus includes: a vibrating section that generates vibration on a structure as a measurement target 4 at predetermined vibrating position in a non-contact manner; a first vibration measurement section that detects the vibration generated on the measurement target 4 at any position in a non-contact manner; a housing 3 in which the vibrating section and the vibration measurement section are disposed at a predetermined distance; a time measurement section that measures the time until the first vibration measurement section detects the vibration wave 6 which is generated on the measurement target 4 by the vibrating section.SELECTED DRAWING: Figure 3
申请公布号 JP2016130684(A) 申请公布日期 2016.07.21
申请号 JP20150004959 申请日期 2015.01.14
申请人 TOSHIBA TEC CORP 发明人 KOMIYA KENICHI;ISHIKAWA DAISUKE
分类号 G01N29/07;G01M7/02 主分类号 G01N29/07
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