| 摘要 |
PROBLEM TO BE SOLVED: To prevent trouble in a circuit provided to a device even when an electronic element such as a TFT formed on a layer under an interlayer insulation film is short-circuited to a wiring formed on the upper side of the interlayer insulation film. SOLUTION: Because a clocked inverter CI0 that is close to the part where the thickness of the insulation film 240 is thinner than that of the other parts when the insulation film 240 is planarized is electrically insulated from the other clocked inverters CI1, CI2, and CI3, the breakage due to the short circuit is confined to the clocked inverter CI0. Accordingly, the clocked inverters CI1, CI2, and CI3 substantially transferring a transfer signal are prevented from being broken. COPYRIGHT: (C)2006,JPO&NCIPI |
