| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of realizing a memory test by addition of a small-sized circuit.SOLUTION: The semiconductor device includes: a memory 2; registers 11 to 14 that store a first data set including test data and read/write instruction data for the memory 2; a first inverting unit 34 that functions to invert a value of the test data output from the register 14; a second inverting unit 32 that functions to invert a value of the read/write instruction data output from the register 12; first and second input units 8 and 7 that input data inversion instructions to the first and second inverting units 34 and 32, respectively; and data switching units 41 to 44 inverting input data to the memory 2 over between a test data set obtained by performing predetermined processing on the first data set output from the registers 11 to 14 via the first and second inverting units 34 and 32 and a second data set for use to read/write data held in the memory 2 during system operation. |
