| 摘要 |
The invention relates to an apparatus and a method for reconstructing a surface of an object (O) by means of structured illumination, in particular with laser light, by means of the following steps: - using at least one projector device (1) to project an overall measurement pattern having measuring elements onto the surface of the object; - using at least one recording device (3) to record the overall measurement pattern on the surface of the object; - using a computer device (5) to calculate, in particular triangulate, for the purpose of reconstructing the surface of the object from a particular distortion of the overall measurement pattern. The invention is distinguished by the fact that the overall measurement pattern (GM) has a sequence of measurement lines (L) as measuring elements; all possible positions of measurement lines (L) in sections which are spatially repeated along the sequence and are referred to as windows (F) are contained in the overall measurement pattern (GM), wherein a particular combination of measurement lines (L) which have been generated and/or have not been generated in the overall measurement pattern (GM) codes the particular location in the overall measurement pattern (GM) in the windows (F). |
