| 摘要 |
PROBLEM TO BE SOLVED: To apply optimal burn-in stress to a sample. SOLUTION: A semiconductor integrated circuit device 50 is provided with a burn-in counter 1, a control unit 2, and a circuit 3 to be tested. The burn-in counter 1 is provided for grasping the burn-in stress applied to the circuit 3 to be tested as a semiconductor storage device. The burn-in counter 1 grasps the burn-in stress (the temperature applied and the voltage applied) applied to the circuit 3 to be tested, counts up (monitors) the burn-in stress, and outputs the burn-in stress information corresponding to the applied temperature, the applied voltage, and a burn-in stress time to the outside. COPYRIGHT: (C)2009,JPO&INPIT
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