发明名称 IMAGE CORRECTING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an image correcting method with a reduction in setting parameter which represents the unification of the shift (alignment) in a sub-pixel unit and image correction. <P>SOLUTION: In the image correcting method, the relation of an inspection reference pattern image with a pattern image to be inspected is identified to construct a numerical formula model absorbing (fitting) the pixel shift or expansion and contraction, undulation noise and sensing noise of an image and an estimate model image is formed by the simulation of the numerical formula model. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006266860(A) 申请公布日期 2006.10.05
申请号 JP20050085214 申请日期 2005.03.24
申请人 ADVANCED MASK INSPECTION TECHNOLOGY KK 发明人 OOAKI JIYUNJI;SUGIHARA SHINJI;NAKATANI YUICHI
分类号 G01N21/956;G01B11/30;G03F1/84;G06T1/00;H01L21/66 主分类号 G01N21/956
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