发明名称 METHOD FOR PRETREATMENT OF BASE SUBSTRATE AND METHOD FOR MANUFACTURING LAYERED BODY USING PRETREATED BASE SUBSTRATE
摘要 Provided is a method for pretreatment of a group III nitride single crystal substrate having a high Al composition ratio, for manufacturing a high-quality group III nitride thin film.;The method includes heating the base substrate at a temperature range of 1000 to 1250° C. for no less than 5 minutes under a first mixed gas atmosphere before a layer of a second group III nitride single crystal is grown, wherein the first mixed gas includes hydrogen gas and nitrogen gas; the base substrate includes a layer of a first group III nitride single crystal at least on a surface of the base substrate; the first group III nitride single crystal is represented by a composition formula of AlAGaBInCN; and the layer of the second group III nitride single crystal is to be grown on the layer of the first group III nitride single crystal.
申请公布号 US2016168752(A1) 申请公布日期 2016.06.16
申请号 US201414905559 申请日期 2014.07.25
申请人 TOKUYAMA CORPORATION 发明人 FURUYA Hiroshi;OBATA Toshiyuki
分类号 C30B25/18;C30B29/40;H01L21/02;C30B25/20 主分类号 C30B25/18
代理机构 代理人
主权项 1. A method for pretreatment of a base substrate comprising the step of: (a) heating the base substrate at a temperature range of 1000 to 1250° C. for no less than 5 minutes under a first nixed gas atmosphere, before a layer of a second group III nitride single crystal is grown, wherein the first mixed gas consists of hydrogen gas and nitrogen gas; the base substrate comprises a layer of a first group III nitride single crystal at least on a surface of the base substrate; the first group III nitride single crystal is represented by a composition formula of: AlAGaBInCN wherein A, B, and C satisfy A+B+C=1.0, 0.5≦A≦1.0, 0≦B≦0.5, and 0≦C≦0.5; the layer of the second group III nitride single crystal is to be grown on the layer of the first group III nitride single crystal; the layer of the second group III nitride single crystal is grown directly on the layer of the first group III nitride single crystal; a surface of the layer of the first group III nitride single crystal on which the layer of the second group III nitride single crystal is to be grown has a root mean square roughness of no more than 5 nm; and the second group III nitride single crystal is a group III nitride single crystal represented by a composition formula of: AlXGaYInZNwherein X, Y, and Z satisfy X+Y+Z=1.0, 0.5≦X≦1.0, 0≦Y≦0.5, and 0≦Z≦0.5.
地址 Yamaguchi JP
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