发明名称 METHOD AND DEVICE FOR IMPROVING THE SAFT ANALYSIS WHEN MEASURING IRREGULARITIES
摘要 <p>The invention relates to a method and to a corresponding device in which irregularities regarding each detected measurement position (M) within a measurement surface (11) are detected using a local measurement density. Each echo signal received in response to each detected measurement position (M) is then weighted in order to generate an image (5) using a data processing device (7) such that the irregularities are adjusted.</p>
申请公布号 IN3891DEN2015(A) 申请公布日期 2015.10.02
申请号 IN2015DELNP3891 申请日期 2015.05.07
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 MOOSHOFER HUBERT
分类号 G01N29/06;G01N29/26;G01S15/89 主分类号 G01N29/06
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