| 摘要 |
PROBLEM TO BE SOLVED: To provide a non-volatile logic gate capable of performing a test by applying existing design tools.SOLUTION: This non-volatile logic gate includes: a non-volatile memory circuit having a non-volatile resistance element in which resistance values are stored; and an arithmetic circuit that includes a test data input terminal for receiving a test data input signal, a test enable signal terminal for receiving a test enable signal; a network circuit comprising a transistor, and a sense circuit for outputting a result according to a current difference flowing in the network circuit on the basis of the resistance value. In a test mode selected by the test enable signal, the test data input terminal is electrically connected to the input terminal of the sense circuit to supply the sense circuit with the test data input signal. |
