发明名称 INPUT DATA TESTING METHOD OF STATION DATA
摘要 PURPOSE: An input data testing method of a station data detects an error in a processor loaded data (PLD) manufacturing step, previously prevents a problem generation, and ensures a perfect processor loaded data (PLD). CONSTITUTION: An input data testing method performs(S210) a diagnostic verification tool after making the office database specification(ODBS), and determines(S220) whether error occurs or not by using the diagnostic verification tool. If the error occurs, the method corrects the ODBS of the input data, performs again the diagnostic verification tool. Thereby, the method previously prevents a problem generated in manufacturing PLD, and thus ensures a perfect processor loaded data (PLD).
申请公布号 KR20000009836(A) 申请公布日期 2000.02.15
申请号 KR19980030484 申请日期 1998.07.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, SEOK HYUN
分类号 H04L1/24;G06F1/24;G06F11/07;(IPC1-7):H04L1/24 主分类号 H04L1/24
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