| 摘要 |
An ion analysis instrument is disclosed comprising an indicator device for providing an indication of a relative positioning of an ion source, a sample, and/or a sampling orifice or capillary of an ion analysis instrument such as a mass or ion mobility spectrometer in order to facilitate re-alignment of one or more of these components following a change. The indicator device comprises a source of electromagnetic radiation such as a pair of lasers or image projection devices. |
