发明名称 METHOD OF MANUFACTURING THIN FILM TRANSISTOR SUBSTRATE
摘要 A method for manufacturing a thin film transistor substrate is provided to etch a data metal layer formed with Mo/Al/Mo layers by using a dry etch process only for preventing the width of wiring from being expanded, thereby simplifying the manufacturing process. A gate wiring containing a gate line(122) and gate electrodes(124) is formed on a substrate. A gate insulating layer and an active layer are sequentially formed on the substrate. A data metal layer, sequentially deposited with first, second, and third metal layers, is formed on the active layer. The third metal layer is dry-etched by a first photoresist pattern. The second and first metal layers are simultaneously dry-etched by the first photoresist pattern and a data line is formed. The active layer is dry-etched by the first photoresist pattern. A second photoresist pattern is formed by etching the first photoresist pattern from which a channel forming region is removed. The channel forming region of the data metal layer is dry-etched by using the second photoresist pattern to form a source electrode(157) and a drain electrode(158). Thereby, the width of the wiring is not expanded and the manufacturing process is simple.
申请公布号 KR20080033590(A) 申请公布日期 2008.04.17
申请号 KR20060099187 申请日期 2006.10.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DUCK JUNG;SONG, DAE HO;KIM, KYUNG SEOP;LEE, YONG EUI
分类号 G02F1/136 主分类号 G02F1/136
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