发明名称 |
METHOD OF MANUFACTURING THIN FILM TRANSISTOR SUBSTRATE |
摘要 |
A method for manufacturing a thin film transistor substrate is provided to etch a data metal layer formed with Mo/Al/Mo layers by using a dry etch process only for preventing the width of wiring from being expanded, thereby simplifying the manufacturing process. A gate wiring containing a gate line(122) and gate electrodes(124) is formed on a substrate. A gate insulating layer and an active layer are sequentially formed on the substrate. A data metal layer, sequentially deposited with first, second, and third metal layers, is formed on the active layer. The third metal layer is dry-etched by a first photoresist pattern. The second and first metal layers are simultaneously dry-etched by the first photoresist pattern and a data line is formed. The active layer is dry-etched by the first photoresist pattern. A second photoresist pattern is formed by etching the first photoresist pattern from which a channel forming region is removed. The channel forming region of the data metal layer is dry-etched by using the second photoresist pattern to form a source electrode(157) and a drain electrode(158). Thereby, the width of the wiring is not expanded and the manufacturing process is simple. |
申请公布号 |
KR20080033590(A) |
申请公布日期 |
2008.04.17 |
申请号 |
KR20060099187 |
申请日期 |
2006.10.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, DUCK JUNG;SONG, DAE HO;KIM, KYUNG SEOP;LEE, YONG EUI |
分类号 |
G02F1/136 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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