发明名称 LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, AND SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus, a device manufacturing method and a substrate. <P>SOLUTION: A substrate W is provided with a coating 4 of a material which is substantially transparent to a wavelength of a projection beam. The coating may be thicker than the wavelength of the projection beam and have a refractive index of the coating 4 such that the wavelength of the projection beam is shortened as the projection beam passes through the coating. This allows the imaging of smaller features on the substrate. Alternatively, the coating may be used with a liquid supply system and act to keep bubbles away from a radiation sensitive layer of the substrate. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008098681(A) 申请公布日期 2008.04.24
申请号 JP20080001122 申请日期 2008.01.08
申请人 ASML NETHERLANDS BV 发明人 DIERICHS MARCEL MATHIJS THEODORE MARIE;MULKENS JOHANNES CATHARINUS HUBERTUS;STREEFKERK BOB
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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