| 摘要 |
The method and system of the invention are intended for testing an electronic unit (3b) by feeding one or more predefined signal shapes created by a signal generator (1 ) of the system as input signals to a known functioning unit (3a) and to a unit to be tested (3b) at corresponding test points (10a, 10b). The resulting signal shapes are measured with a measuring instrument (4) of the system from both units (3a, 3b) at corresponding measurement points (8d, 8e, 8f and 8g, 8h, 8i) simultaneously or separately. At least one resulting signal shape from the good unit (3a) is then compared with the corresponding resulting signal shape from the unit to be tested (3b). A fault in the unit to be tested (3b) is detected on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested. The electronic unit under test (3b)is comprised in the system simultaneously or interchangeably with the electronic functioning unit (3a). The resulting signal shape is presented by transforming it into discrete values that describe the signal shape. The computer program product of the invention executes the method steps when run in computer readable media in the system. The method of the invention is used for electronics production testing, fault identification in electronics repair, component testing in manufacturing and repair, or counterfeit component identification. |
