发明名称 |
THREE-DIMENSIONAL DEVICES HAVING REDUCED CONTACT LENGTH |
摘要 |
Various embodiments comprise apparatuses and methods including a memory array having alternating levels of semiconductor materials and dielectric material with strings of memory cells formed on the alternating levels. One such apparatus includes a memory array formed substantially within a cavity of a substrate. Peripheral circuitry can be formed adjacent to a surface of the substrate and adjacent to the memory array. Additional apparatuses and methods are described. |
申请公布号 |
US2016254265(A1) |
申请公布日期 |
2016.09.01 |
申请号 |
US201615154335 |
申请日期 |
2016.05.13 |
申请人 |
Micron Technology, Inc. |
发明人 |
Tanzawa Toru |
分类号 |
H01L27/108;H01L21/74;H01L27/02;H01L27/11 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming an apparatus, the method comprising:
forming a cavity in a substrate; forming the three-dimensional circuit substantially within the cavity, the cavity having a depth substantially equivalent to a height of the three-dimensional circuit; and forming support circuitry adjacent to the cavity and proximate to a surface of the substrate, an upper surface of the support circuitry being substantially coplanar with an upper surface of the three-dimensional circuit. |
地址 |
Boise ID US |