发明名称 THREE-DIMENSIONAL DEVICES HAVING REDUCED CONTACT LENGTH
摘要 Various embodiments comprise apparatuses and methods including a memory array having alternating levels of semiconductor materials and dielectric material with strings of memory cells formed on the alternating levels. One such apparatus includes a memory array formed substantially within a cavity of a substrate. Peripheral circuitry can be formed adjacent to a surface of the substrate and adjacent to the memory array. Additional apparatuses and methods are described.
申请公布号 US2016254265(A1) 申请公布日期 2016.09.01
申请号 US201615154335 申请日期 2016.05.13
申请人 Micron Technology, Inc. 发明人 Tanzawa Toru
分类号 H01L27/108;H01L21/74;H01L27/02;H01L27/11 主分类号 H01L27/108
代理机构 代理人
主权项 1. A method of forming an apparatus, the method comprising: forming a cavity in a substrate; forming the three-dimensional circuit substantially within the cavity, the cavity having a depth substantially equivalent to a height of the three-dimensional circuit; and forming support circuitry adjacent to the cavity and proximate to a surface of the substrate, an upper surface of the support circuitry being substantially coplanar with an upper surface of the three-dimensional circuit.
地址 Boise ID US