SCREENING OF NANOPARTICLE PROPERTIES

摘要

1. A nanoparticle screening chip and a method using said chip allowing for determining physical properties of nanoparticles, wherein the screening chip comprises
a substrate having a working surface divided into a by a plurality of areas,
wherein
(1) each of these areas presents different surface properties defined by surface energy component (d,b,a), the total free energy ³ TOT of the surface of each area being defined as follows: ³ TOT = ³ LW + 2 ³ + ³ - 0.5
wherein the components are:
³ LW = dispersive component = d
³ + = electron acceptor component = b
³ - = electron donor component = a
and
(2) each of these areas comprises a plurality of subareas, each subarea comprising an array of sub-micrometric holes or elongated grooves with a different aperture size (S1, S2, S3, ...).