发明名称 PROCESS OF MAKING STRUCTURE HAVING EMBEDDED DIELECTRIC LAYER OF UNIFORM THICKNESS
摘要 PROBLEM TO BE SOLVED: To provide an improved process for making a structure having an embedded dielectric layer of uniform thickness.MEANS FOR SOLVING THE PROBLEM: A process for making a final structure (5) including a useful semiconductor layer (3'), a dielectric layer (2), and a carrier substrate (4) continuously includes a step of providing an intermediate structure (1) including an upper semiconductor layer (3), the dielectric layer (2), and the carrier substrate (4), and a step of finishing the intermediate structure (1) for forming the final structure (5), and including a processing for changing the thickness of the dielectric layer (2) according to a melting profile determined. In the process, the dielectric layer (2) of the intermediate structure (1) has a thickness profile complementary to the melting profile thus determined.SELECTED DRAWING: Figure 2a
申请公布号 JP2016192548(A) 申请公布日期 2016.11.10
申请号 JP20160066013 申请日期 2016.03.29
申请人 SOYTEC 发明人 CAROLE DAVID;ANNE-SOPHIE COCCHI
分类号 H01L21/02;H01L21/324;H01L27/12 主分类号 H01L21/02
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