发明名称 Lead condition assessment for an implantable medical device
摘要 A method, system, and apparatus for performing a lead condition assessment and/or a lead orientation determination associated with an implantable medical device (IMD). A first impedance is determined. The first impedance relates to the impedance relative to a first electrode and a portion of the IMD. A second impedance is determined. The second impedance relates to the impedance relative to a second electrode and the portion of the IMD. The first impedance is compared with the second impedance to determine an impedance difference. A determination is made whether the impedance difference is outside a predetermined tolerance range. Furthermore, artifact measured during impedance measurements or test pulses may be compared to assess lead orientation. An indication of a lead condition error is provided in response to determining that the impedance difference is outside the predetermined tolerance range.
申请公布号 US2007100407(A1) 申请公布日期 2007.05.03
申请号 US20050262243 申请日期 2005.10.28
申请人 CYBERONICS, INC. 发明人 ARMSTRONG RANDOLPH K.
分类号 A61N1/05 主分类号 A61N1/05
代理机构 代理人
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