| 摘要 |
Method for multi-parameter structural diagnostics of monocrystals with several types of defects by means of two-crystal and three-crystal diffractometers, one performs complex measurement of dependences on conditions of dynamical diffraction of one- and two-dimensional angular distributions of intensities of diffractions, profiles, areas and volumes of peaks of those, in particular on thickness of sample (t), wavelength (λ), azimuth (&phgr;), deformation (1/ &rgr;), geometry of Bragg or Laue diffraction and asymmetry of survey, this provides controlled change by means of variation of conditions of diffraction input to intensity of dissipation of diffuse component and specific inputs of defects of different types. |
