发明名称 |
METHOD OF CALIBRATING SURFACE SHAPE MEASUREMENT INSTRUMENT, AND SURFACE SHAPE MEASUREMENT INSTRUMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of calibrating a surface shape measurement instrument which accurately and simply obtains a moving distance of a scanning member in the elevation direction in response to a change in a voltage applied to a piezoelectric element in comparison with a conventional method. SOLUTION: A relationship between the moving distance of a Z stage 11 measured by a laser holoscale 12 and a displacement of a cantilever 5 measured by a displacement detecting section 6 is obtained by moving the Z stage 11 toward a surface of a sample. A relationship between the change in the voltage applied to the piezoelectric element 7 and the displacement of the cantilever 5 measured by the displacement detecting section is obtained by changing the voltage applied to the piezoelectric element 7. The moving distance of the cantilever 5 in the elevation direction in response to the change in the voltage applied to the piezoelectric element is calculated by combining ratios obtained from two detection results. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008224587(A) |
申请公布日期 |
2008.09.25 |
申请号 |
JP20070066541 |
申请日期 |
2007.03.15 |
申请人 |
ALPS ELECTRIC CO LTD |
发明人 |
WASHIZU MISAKI;IWASAKI JUN;ABE HIROSHI;KAYANO SHIRO |
分类号 |
G01B5/00;G01Q10/04;G01Q30/06 |
主分类号 |
G01B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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