发明名称 |
Layered Film Fabrication Method, Layered Film Defect Detection Method, Layered Film Defect Detection Device, Layered Film, and Image Display Device |
摘要 |
Provided are a layered film defect detection device capable of performing defect detection considering irregularities of optical performance of a phase difference layer constituting the layered film without requiring insertion of a new part into an optical path; and a layered film defect detection method. A defect detection device used for a layered film (11) having a polarizing plate (1) and a phase difference layer (separator (2)) includes: a light source (12) arranged at one side of the film surfaces of the layered film (11), an imaging unit (13) arranged on the other side of the film surface; an inspection polarization filter (15) arranged between the light source (12) and the imaging unit (13); a defect detection unit (14b) for detecting a defect existing on the polarizing plate (1) according to the captured image; and an optical axis adjusting unit (16) for adjusting a relative angle position of the polarization axis (L2) of a polarizing filter (15) and a polarization axis (L1) of a polarizer (2). In the detection device, the relative angle position of the polarizing filter (15) is adjusted within a range of the polarization axis angle x of the polarizing filter satisfying the relationship 0 degrees<x f 15 degrees so as to minimize the visible light quantity inputted to the imaging unit.
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申请公布号 |
US2009009864(A1) |
申请公布日期 |
2009.01.08 |
申请号 |
US20070160150 |
申请日期 |
2007.01.10 |
申请人 |
NITTO DENKO CORPORATION |
发明人 |
KOBAYASHI TAKAMASA;SHIKAMI MASAKI;MIKASA YASUYUKI |
分类号 |
G02B5/30;G01N21/00 |
主分类号 |
G02B5/30 |
代理机构 |
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代理人 |
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地址 |
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