发明名称 Layered Film Fabrication Method, Layered Film Defect Detection Method, Layered Film Defect Detection Device, Layered Film, and Image Display Device
摘要 Provided are a layered film defect detection device capable of performing defect detection considering irregularities of optical performance of a phase difference layer constituting the layered film without requiring insertion of a new part into an optical path; and a layered film defect detection method. A defect detection device used for a layered film (11) having a polarizing plate (1) and a phase difference layer (separator (2)) includes: a light source (12) arranged at one side of the film surfaces of the layered film (11), an imaging unit (13) arranged on the other side of the film surface; an inspection polarization filter (15) arranged between the light source (12) and the imaging unit (13); a defect detection unit (14b) for detecting a defect existing on the polarizing plate (1) according to the captured image; and an optical axis adjusting unit (16) for adjusting a relative angle position of the polarization axis (L2) of a polarizing filter (15) and a polarization axis (L1) of a polarizer (2). In the detection device, the relative angle position of the polarizing filter (15) is adjusted within a range of the polarization axis angle x of the polarizing filter satisfying the relationship 0 degrees<x f 15 degrees so as to minimize the visible light quantity inputted to the imaging unit.
申请公布号 US2009009864(A1) 申请公布日期 2009.01.08
申请号 US20070160150 申请日期 2007.01.10
申请人 NITTO DENKO CORPORATION 发明人 KOBAYASHI TAKAMASA;SHIKAMI MASAKI;MIKASA YASUYUKI
分类号 G02B5/30;G01N21/00 主分类号 G02B5/30
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