发明名称 Image acquisition method and system
摘要 A method of acquiring an image of a scene illuminated by a first beam, by means of a sensor including at least two pixels, including the steps of: a) for each pixel, reading a first output value of the pixel representative of the intensity of the radiation received by the pixel during a first integration period during which the sensor is illuminated by a second beam coherent with the first beam; and b) for each pixel, reading a second output value of the pixel representative of the intensity of the radiation received by the pixel during a second integration period during which the sensor is not illuminated by the second beam, wherein steps a) and b) are repeated a plurality of times by changing, between two successive iterations, the angle of incidence or a phase parameter of the second beam.
申请公布号 US9462198(B2) 申请公布日期 2016.10.04
申请号 US201414196794 申请日期 2014.03.04
申请人 Commissariat a l'energie atomique et aux energies alternatives 发明人 Boukhayma Assim;Dupret Antoine
分类号 G01N21/35;H04N5/30;G01N21/3586;G01N21/3581;G01S17/89 主分类号 G01N21/35
代理机构 Kaplan Breyer Schwarz & Ottesen, LLP 代理人 Kaplan Breyer Schwarz & Ottesen, LLP
主权项 1. A method of acquiring an image of a scene illuminated by a first electromagnetic wave beam, by means of a sensor comprising at least two pixels sensitive to said first electromagnetic wave beam, comprising the steps of: a) for each pixel, reading a first output value of the pixel representative of the intensity of the radiation received by the pixel during a first integration period during which the sensor is illuminated by a second electromagnetic wave beam coherent with the first beam; and b) for each pixel, reading a second output value of the pixel representative of the intensity of the radiation received by the pixel during a second integration period during which the sensor is not illuminated by the second beam, wherein steps a) and b) are repeated a plurality of times by changing, between two successive iterations, the angle of incidence or a phase parameter of the second beam.
地址 FR