发明名称 |
Image acquisition method and system |
摘要 |
A method of acquiring an image of a scene illuminated by a first beam, by means of a sensor including at least two pixels, including the steps of: a) for each pixel, reading a first output value of the pixel representative of the intensity of the radiation received by the pixel during a first integration period during which the sensor is illuminated by a second beam coherent with the first beam; and b) for each pixel, reading a second output value of the pixel representative of the intensity of the radiation received by the pixel during a second integration period during which the sensor is not illuminated by the second beam, wherein steps a) and b) are repeated a plurality of times by changing, between two successive iterations, the angle of incidence or a phase parameter of the second beam. |
申请公布号 |
US9462198(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201414196794 |
申请日期 |
2014.03.04 |
申请人 |
Commissariat a l'energie atomique et aux energies alternatives |
发明人 |
Boukhayma Assim;Dupret Antoine |
分类号 |
G01N21/35;H04N5/30;G01N21/3586;G01N21/3581;G01S17/89 |
主分类号 |
G01N21/35 |
代理机构 |
Kaplan Breyer Schwarz & Ottesen, LLP |
代理人 |
Kaplan Breyer Schwarz & Ottesen, LLP |
主权项 |
1. A method of acquiring an image of a scene illuminated by a first electromagnetic wave beam, by means of a sensor comprising at least two pixels sensitive to said first electromagnetic wave beam, comprising the steps of: a) for each pixel, reading a first output value of the pixel representative of the intensity of the radiation received by the pixel during a first integration period during which the sensor is illuminated by a second electromagnetic wave beam coherent with the first beam; and b) for each pixel, reading a second output value of the pixel representative of the intensity of the radiation received by the pixel during a second integration period during which the sensor is not illuminated by the second beam, wherein steps a) and b) are repeated a plurality of times by changing, between two successive iterations, the angle of incidence or a phase parameter of the second beam. |
地址 |
FR |