发明名称 デバイスインターフェイス装置、試験装置、および試験方法
摘要 A test apparatus that easily tests a device under test having an optical interface. Provided is a test method, a test apparatus, and a device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising a device mounting section on which the device under test is mounted; an optical connector that is connected to the optical interface of the device under test; and an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.
申请公布号 JP6043246(B2) 申请公布日期 2016.12.14
申请号 JP20130145445 申请日期 2013.07.11
申请人 株式会社アドバンテスト 发明人 原 英生;増田 伸
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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