发明名称 |
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor memory device includes a stack including gate electrodes sequentially stacked on a substrate, a vertical insulating structure penetrating the stack vertically with respect to the gate electrodes, a vertical channel portion disposed on an inner side surface of the vertical insulating structure, and a common source region formed in the substrate and spaced apart from the vertical channel portion. A bottom region of the vertical channel portion has a protruding surface in contact with a bottom region of the vertical insulating structure. |
申请公布号 |
US2016276365(A1) |
申请公布日期 |
2016.09.22 |
申请号 |
US201615066619 |
申请日期 |
2016.03.10 |
申请人 |
CHOI JI-HOON;LIM SEUNGHYUN;KIM SUNGGIL;KIM HONGSUK;LIM HUNHYEONG;SIM HYUNJUN |
发明人 |
CHOI JI-HOON;LIM SEUNGHYUN;KIM SUNGGIL;KIM HONGSUK;LIM HUNHYEONG;SIM HYUNJUN |
分类号 |
H01L27/115;H01L29/10 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device, comprising:
a stack including gate electrodes sequentially stacked on a substrate; a vertical insulating structure penetrating the stack vertically with respect to the gate electrodes; a vertical channel portion disposed on an inner surface of the vertical insulating structure; and a common source region formed in the substrate and spaced apart from the vertical channel portion, wherein a bottom region of the vertical channel portion has a protruding surface in contact with a bottom region of the vertical insulating structure. |
地址 |
SEONGNAM-SI KR |