发明名称 THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor memory device includes a stack including gate electrodes sequentially stacked on a substrate, a vertical insulating structure penetrating the stack vertically with respect to the gate electrodes, a vertical channel portion disposed on an inner side surface of the vertical insulating structure, and a common source region formed in the substrate and spaced apart from the vertical channel portion. A bottom region of the vertical channel portion has a protruding surface in contact with a bottom region of the vertical insulating structure.
申请公布号 US2016276365(A1) 申请公布日期 2016.09.22
申请号 US201615066619 申请日期 2016.03.10
申请人 CHOI JI-HOON;LIM SEUNGHYUN;KIM SUNGGIL;KIM HONGSUK;LIM HUNHYEONG;SIM HYUNJUN 发明人 CHOI JI-HOON;LIM SEUNGHYUN;KIM SUNGGIL;KIM HONGSUK;LIM HUNHYEONG;SIM HYUNJUN
分类号 H01L27/115;H01L29/10 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a stack including gate electrodes sequentially stacked on a substrate; a vertical insulating structure penetrating the stack vertically with respect to the gate electrodes; a vertical channel portion disposed on an inner surface of the vertical insulating structure; and a common source region formed in the substrate and spaced apart from the vertical channel portion, wherein a bottom region of the vertical channel portion has a protruding surface in contact with a bottom region of the vertical insulating structure.
地址 SEONGNAM-SI KR