发明名称 ATOMIC LAYER PROCESS CHAMBER FOR 3D CONFORMAL PROCESSING
摘要 Embodiments described herein relate to methods for forming or treating material layers on semiconductor substrates. In one embodiment, a method for performing an atomic layer process includes delivering a species to a surface of a substrate at a first temperature, followed by spike annealing the surface of the substrate to a second temperature to cause a reaction between the species and the molecules on the surface of the substrate. The second temperature is higher than the first temperature. By repeating the delivering and spike annealing processes, a conformal layer is formed on the surface of the substrate or a conformal etching process is performed on the surface of the substrate.
申请公布号 US2016276162(A1) 申请公布日期 2016.09.22
申请号 US201615071479 申请日期 2016.03.16
申请人 Applied Materials, Inc. 发明人 LIU Wei;MAYUR Abhilash J.;STOUT Phillip
分类号 H01L21/3065;H01L21/67;H01L21/687;H01L21/02 主分类号 H01L21/3065
代理机构 代理人
主权项 1. A method, comprising: delivering a species to a surface of a substrate, wherein the substrate is at a first temperature, wherein the species is adsorbed on the surface of the substrate; heating the surface of the substrate to a second temperature, wherein at the second temperature the species reacts with the surface of the substrate; and repeating the delivering and the heating processes.
地址 Santa Clara CA US