发明名称 |
ATOMIC LAYER PROCESS CHAMBER FOR 3D CONFORMAL PROCESSING |
摘要 |
Embodiments described herein relate to methods for forming or treating material layers on semiconductor substrates. In one embodiment, a method for performing an atomic layer process includes delivering a species to a surface of a substrate at a first temperature, followed by spike annealing the surface of the substrate to a second temperature to cause a reaction between the species and the molecules on the surface of the substrate. The second temperature is higher than the first temperature. By repeating the delivering and spike annealing processes, a conformal layer is formed on the surface of the substrate or a conformal etching process is performed on the surface of the substrate. |
申请公布号 |
US2016276162(A1) |
申请公布日期 |
2016.09.22 |
申请号 |
US201615071479 |
申请日期 |
2016.03.16 |
申请人 |
Applied Materials, Inc. |
发明人 |
LIU Wei;MAYUR Abhilash J.;STOUT Phillip |
分类号 |
H01L21/3065;H01L21/67;H01L21/687;H01L21/02 |
主分类号 |
H01L21/3065 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method, comprising:
delivering a species to a surface of a substrate, wherein the substrate is at a first temperature, wherein the species is adsorbed on the surface of the substrate; heating the surface of the substrate to a second temperature, wherein at the second temperature the species reacts with the surface of the substrate; and repeating the delivering and the heating processes. |
地址 |
Santa Clara CA US |