| 发明名称 |
ROUNDNESS MEASURING APPARATUS |
| 摘要 |
A roundness measuring apparatus, which has a small space required for installation and of which measurement error due to a temperature change is small, is disclosed. The roundness measuring apparatus includes: a base; a turn-table which is fixed to the base and rotates a work placed on the turn-table; a two-dimensional moving mechanism provided at the base so as to move a holder holding part in parallel to a measurement plane including a rotation axis of the turn-table and a measuring point of the work; a detector holder attached to the holder holding part; and a detector attached to the detector holder so that a probe can be displaced on the measurement plane. |
| 申请公布号 |
US2016161239(A1) |
申请公布日期 |
2016.06.09 |
| 申请号 |
US201414565058 |
申请日期 |
2014.12.09 |
| 申请人 |
Tokyo Seimitsu Co., Ltd. |
发明人 |
Takanashi Ryo |
| 分类号 |
G01B5/20 |
主分类号 |
G01B5/20 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A roundness measuring apparatus comprising:
a base; a turn-table which is fixed to the base and rotates a work placed on the turn-table; a two-dimensional moving mechanism provided at the base so as to move a holder holding part in parallel to a measurement plane including a rotation axis of the turn-table and a measuring point of the work; a detector holder attached to the holder holding part; and a detector attached to the detector holder so that a probe can be displaced on the measurement plane. |
| 地址 |
Tokyo JP |
