发明名称 OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optical measurement technology that can obtain a plane intensity distribution of ultraviolet light.SOLUTION: An optical measurement device 10 comprises a wavelength conversion plate 20 that includes a wavelength conversion material converts ultraviolet light 61 into visible light 62, and has a first principal plane 21, and a second principal plane 22 provided on a side opposite the first principal plane 21 to convert the ultraviolet light 61 to be incident upon the first principal plane 21 into the visible light 62 and causing the visible light to be emitted. The optical measurement device 10 may include: a transparent substrate 24 that transmits the ultraviolet light 61; and a wavelength conversion layer 26 that includes the wavelength conversion material to be provided on the transparent substrate 24. The first principal plane 21, transparent substrate 24, wavelength conversion layer 26 and second principal plane 22 may be sequentially arranged.SELECTED DRAWING: Figure 1
申请公布号 JP2016211970(A) 申请公布日期 2016.12.15
申请号 JP20150096029 申请日期 2015.05.08
申请人 NIKKISO CO LTD 发明人 OCHI TETSUMI
分类号 G01J1/02 主分类号 G01J1/02
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