| 摘要 |
PROBLEM TO BE SOLVED: To rank characteristic models of a plurality of semiconductor components.SOLUTION: A second characteristic model is generated from a plurality of first characteristic models with respective electrical characteristics of a plurality of semiconductor components described by using a maximum value and a minimum value of a prescribed parameter to the plurality of first characteristic models, and the second characteristic model is used to execute simulation. A result of the simulation is used to calculate a plurality of first margins to an evaluation item, and the maximum value and the minimum value of the prescribed parameter to each of the plurality of first characteristic models are used to calculate a plurality of second margins to each of the plurality of first characteristic models to the evaluation item. A ratio of the maximum margin of the plurality of first margins to each of the plurality of second margins is calculated, and the plurality of first characteristic models are ranked on the basis of the ratio.SELECTED DRAWING: Figure 1 |
