发明名称 TREATMENT METHOD OF SEMICONDUCTOR SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a thermal treatment method of a semiconductor substrate for stably manufacturing the semiconductor substrate in which the in-plane variation of the distribution of a dopant diffused in the semiconductor substrate is suppressed, when the thermal processing is performed to diffuse a diffusate in the semiconductor substrate using a horizontal diffusion furnace. <P>SOLUTION: The thermal treatment method of a semiconductor substrate which diffuses the diffusate serving as the dopant within the semiconductor substrate in the semiconductor substrate has a process to coat a diffusing agent containing at least the above diffusate and silica at least in the surface of the semiconductor substrate, a process to mount the plurality of semiconductor substrates coated by the diffusing agent on the board for diffusion, a process to inject the board for diffusing on which the plurality of the semiconductor substrates is mounted into the horizontal diffusion furnace at a rate of 500 mm or more per minutes, and a process to diffuse the diffusate in the semiconductor substrate by thermal processing the plurality of semiconductor substrates at once in the horizontal diffusion furnace. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008028158(A) 申请公布日期 2008.02.07
申请号 JP20060199196 申请日期 2006.07.21
申请人 SHIN ETSU HANDOTAI CO LTD;NAOETSU ELECTRONICS CO LTD;SHIN ETSU CHEM CO LTD 发明人 SAISU SHIGENORI;OTSUKA HIROYUKI;ISHIKAWA NAOKI;AKATSUKA TAKESHI;KOSUGI AKIRA
分类号 H01L21/225;H01L31/04 主分类号 H01L21/225
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